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BibTeX record conf/vts/DobbelaereSVPR18
@inproceedings{DBLP:conf/vts/DobbelaereSVPR18, author = {Wim Dobbelaere and On Semi and Massimo Violante and Turin Polytechnic and Jeff Rearick}, title = {Innovative practices on quality levels of {A/MS} devices}, booktitle = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA, USA, April 22-25, 2018}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2018}, url = {https://doi.org/10.1109/VTS.2018.8368629}, doi = {10.1109/VTS.2018.8368629}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/DobbelaereSVPR18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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