BibTeX record conf/vts/HosokawaDM02

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@inproceedings{DBLP:conf/vts/HosokawaDM02,
  author       = {Toshinori Hosokawa and
                  Hiroshi Date and
                  Michiaki Muraoka},
  title        = {A Test Generation Method Using a Compacted Test Table and a Test Generation
                  Method Using a Compacted Test Plan Table for {RTL} Data Path Circuits},
  booktitle    = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
                  a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
  pages        = {328--335},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/VTS.2002.1011161},
  doi          = {10.1109/VTS.2002.1011161},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HosokawaDM02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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