BibTeX record conf/vts/Oakland91

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@inproceedings{DBLP:conf/vts/Oakland91,
  author       = {Steven F. Oakland},
  title        = {Combining {IEEE} Standard 1149.1 with reduced-pin-count component
                  test},
  booktitle    = {9th {IEEE} {VLSI} Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic
                  City, NJ, {USA}},
  pages        = {78--84},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/VTEST.1991.208137},
  doi          = {10.1109/VTEST.1991.208137},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Oakland91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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