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BibTeX record journals/candie/YoonLCK08
@article{DBLP:journals/candie/YoonLCK08, author = {Young{-}Geun Yoon and Seok{-}Lyong Lee and Chin{-}Wan Chung and Sang{-}Hee Kim}, title = {An effective defect inspection system for polarized film images using image segmentation and template matching techniques}, journal = {Comput. Ind. Eng.}, volume = {55}, number = {3}, pages = {567--583}, year = {2008}, url = {https://doi.org/10.1016/j.cie.2008.01.015}, doi = {10.1016/J.CIE.2008.01.015}, timestamp = {Thu, 20 Feb 2020 13:17:45 +0100}, biburl = {https://dblp.org/rec/journals/candie/YoonLCK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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