BibTeX record journals/corr/JiLYGDVVCSBJSBK15

• > Home > journals/corr/JiLYGDVVCSBJSBK15

@article{DBLP:journals/corr/JiLYGDVVCSBJSBK15,
  author       = {Brian L. Ji and
                  H. Li and
                  Q. Ye and
                  S. Gausepohl and
                  S. Deora and
                  Dmitry Veksler and
                  S. Vivekanand and
                  H. Chong and
                  H. Stamper and
                  T. Burroughs and
                  C. Johnson and
                  M. Smalley and
                  S. Bennett and
                  V. Kaushik and
                  J. Piccirillo and
                  M. Rodgers and
                  M. Passaro and
                  M. Liehr},
  title        = {In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive
                  Memory},
  journal      = {CoRR},
  volume       = {abs/1509.00070},
  year         = {2015},
  url          = {http://arxiv.org/abs/1509.00070},
  eprinttype    = {arXiv},
  eprint       = {1509.00070},
  timestamp    = {Wed, 24 May 2023 09:11:23 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/JiLYGDVVCSBJSBK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}