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BibTeX record journals/dt/KeaneKLS12
@article{DBLP:journals/dt/KeaneKLS12, author = {John Keane and Chris H. Kim and Qunzeng Liu and Sachin S. Sapatnekar}, title = {Process and Reliability Sensors for Nanoscale {CMOS}}, journal = {{IEEE} Des. Test Comput.}, volume = {29}, number = {5}, pages = {8--17}, year = {2012}, url = {https://doi.org/10.1109/MDT.2012.2211561}, doi = {10.1109/MDT.2012.2211561}, timestamp = {Sun, 17 May 2020 11:44:13 +0200}, biburl = {https://dblp.org/rec/journals/dt/KeaneKLS12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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