BibTeX record journals/et/ChangLC02

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@article{DBLP:journals/et/ChangLC02,
  author       = {Soon{-}Jyh Chang and
                  Chung{-}Len Lee and
                  Jwu E. Chen},
  title        = {Structural Fault Based Specification Reduction for Testing Analog
                  Circuits},
  journal      = {J. Electron. Test.},
  volume       = {18},
  number       = {6},
  pages        = {571--581},
  year         = {2002},
  url          = {https://doi.org/10.1023/A:1020892721493},
  doi          = {10.1023/A:1020892721493},
  timestamp    = {Tue, 07 Mar 2023 08:43:11 +0100},
  biburl       = {https://dblp.org/rec/journals/et/ChangLC02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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