BibTeX record journals/et/HamdiouiG00

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@article{DBLP:journals/et/HamdiouiG00,
  author       = {Said Hamdioui and
                  Ad J. van de Goor},
  title        = {Testing Address Decoder Faults in Two-Port Memories: Fault Models,
                  Tests, Consequences of Port Restrictions, and Test Strategy},
  journal      = {J. Electron. Test.},
  volume       = {16},
  number       = {5},
  pages        = {487--498},
  year         = {2000},
  url          = {https://doi.org/10.1023/A:1008320716847},
  doi          = {10.1023/A:1008320716847},
  timestamp    = {Fri, 11 Sep 2020 15:03:16 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HamdiouiG00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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