BibTeX record journals/et/ViilukasKRJUF12

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@article{DBLP:journals/et/ViilukasKRJUF12,
  author       = {Taavi Viilukas and
                  Anton Karputkin and
                  Jaan Raik and
                  Maksim Jenihhin and
                  Raimund Ubar and
                  Hideo Fujiwara},
  title        = {Identifying Untestable Faults in Sequential Circuits Using Test Path
                  Constraints},
  journal      = {J. Electron. Test.},
  volume       = {28},
  number       = {4},
  pages        = {511--521},
  year         = {2012},
  url          = {https://doi.org/10.1007/s10836-012-5312-5},
  doi          = {10.1007/S10836-012-5312-5},
  timestamp    = {Mon, 26 Oct 2020 08:48:45 +0100},
  biburl       = {https://dblp.org/rec/journals/et/ViilukasKRJUF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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