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BibTeX record journals/et/YonedaF02
@article{DBLP:journals/et/YonedaF02, author = {Tomokazu Yoneda and Hideo Fujiwara}, title = {Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores}, journal = {J. Electron. Test.}, volume = {18}, number = {4-5}, pages = {487--501}, year = {2002}, url = {https://doi.org/10.1023/A:1016553809732}, doi = {10.1023/A:1016553809732}, timestamp = {Fri, 11 Sep 2020 15:02:16 +0200}, biburl = {https://dblp.org/rec/journals/et/YonedaF02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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