BibTeX record journals/ieicet/ChenHC18

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@article{DBLP:journals/ieicet/ChenHC18,
  author       = {Shen{-}Li Chen and
                  Yu{-}Ting Huang and
                  Shawn Chang},
  title        = {Design and Impact on {ESD/LU} Immunities by Drain-Side Super-Junction
                  Structures in Low-(High-)Voltage MOSFETs for the Power Applications},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {101-C},
  number       = {3},
  pages        = {143--150},
  year         = {2018},
  url          = {https://doi.org/10.1587/transele.E101.C.143},
  doi          = {10.1587/TRANSELE.E101.C.143},
  timestamp    = {Sat, 11 Apr 2020 14:48:39 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/ChenHC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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