Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record journals/ieicet/HamamuraMTKIKFKFNK09
@article{DBLP:journals/ieicet/HamamuraMTKIKFKFNK09, author = {Yuichi Hamamura and Chizu Matsumoto and Yoshiyuki Tsunoda and Koji Kamoda and Yoshio Iwata and Kenji Kanamitsu and Daisuke Fujiki and Fujihiko Kojika and Hiromi Fujita and Yasuo Nakagawa and Shun'ichi Kaneko}, title = {Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing}, journal = {{IEICE} Trans. Electron.}, volume = {92-C}, number = {1}, pages = {144--152}, year = {2009}, url = {https://doi.org/10.1587/transele.E92.C.144}, doi = {10.1587/TRANSELE.E92.C.144}, timestamp = {Sat, 11 Apr 2020 14:47:41 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/HamamuraMTKIKFKFNK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.