BibTeX record journals/ieicet/IkawaYHAO10

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@article{DBLP:journals/ieicet/IkawaYHAO10,
  author       = {Yusuke Ikawa and
                  Yorihide Yuasa and
                  Cheng{-}Yu Hu and
                  Jin{-}Ping Ao and
                  Yasuo Ohno},
  title        = {2D Device Simulation of AlGaN/GaN {HFET} Current Collapse Caused by
                  Surface Negative Charge Injection},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {93-C},
  number       = {8},
  pages        = {1218--1224},
  year         = {2010},
  url          = {https://doi.org/10.1587/transele.E93.C.1218},
  doi          = {10.1587/TRANSELE.E93.C.1218},
  timestamp    = {Sat, 11 Apr 2020 14:48:53 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/IkawaYHAO10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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