BibTeX record journals/ieicet/InoueHF10

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@article{DBLP:journals/ieicet/InoueHF10,
  author       = {Ryoichi Inoue and
                  Toshinori Hosokawa and
                  Hideo Fujiwara},
  title        = {A Fault Dependent Test Generation Method for State-Observable FSMs
                  to Increase Defect Coverage under the Test Length Constraint},
  journal      = {{IEICE} Trans. Inf. Syst.},
  volume       = {93-D},
  number       = {1},
  pages        = {24--32},
  year         = {2010},
  url          = {https://doi.org/10.1587/transinf.E93.D.24},
  doi          = {10.1587/TRANSINF.E93.D.24},
  timestamp    = {Sat, 11 Apr 2020 15:27:26 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/InoueHF10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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