BibTeX record journals/ieicet/MichinishiYOKH07

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@article{DBLP:journals/ieicet/MichinishiYOKH07,
  author       = {Hiroyuki Michinishi and
                  Tokumi Yokohira and
                  Takuji Okamoto and
                  Toshifumi Kobayashi and
                  Tsutomu Hondo},
  title        = {Detection of {CMOS} Open Node Defects by Frequency Analysis},
  journal      = {{IEICE} Trans. Inf. Syst.},
  volume       = {90-D},
  number       = {3},
  pages        = {685--687},
  year         = {2007},
  url          = {https://doi.org/10.1093/ietisy/e90-d.3.685},
  doi          = {10.1093/IETISY/E90-D.3.685},
  timestamp    = {Sat, 11 Apr 2020 15:24:59 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/MichinishiYOKH07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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