BibTeX record journals/jetc/KoneruKC17

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@article{DBLP:journals/jetc/KoneruKC17,
  author       = {Abhishek Koneru and
                  Sukeshwar Kannan and
                  Krishnendu Chakrabarty},
  title        = {Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay
                  Testing of Monolithic 3D Integrated Circuits},
  journal      = {{ACM} J. Emerg. Technol. Comput. Syst.},
  volume       = {13},
  number       = {4},
  pages        = {54:1--54:23},
  year         = {2017},
  url          = {https://doi.org/10.1145/3041026},
  doi          = {10.1145/3041026},
  timestamp    = {Mon, 03 Jan 2022 22:08:36 +0100},
  biburl       = {https://dblp.org/rec/journals/jetc/KoneruKC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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