BibTeX record journals/mr/CericOS12

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@article{DBLP:journals/mr/CericOS12,
  author       = {Hajdin Ceric and
                  Roberto Lacerda de Orio and
                  Siegfried Selberherr},
  title        = {Interconnect reliability dependence on fast diffusivity paths},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {8},
  pages        = {1532--1538},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.035},
  doi          = {10.1016/J.MICROREL.2011.09.035},
  timestamp    = {Thu, 14 Oct 2021 09:38:48 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CericOS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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