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BibTeX record journals/mr/ChongCPNTL06
@article{DBLP:journals/mr/ChongCPNTL06, author = {Desmond Y. R. Chong and F. X. Che and John H. L. Pang and Kellin Ng and Jane Y. N. Tan and Patrick T. H. Low}, title = {Drop impact reliability testing for lead-free and lead-based soldered {IC} packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1160--1171}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.011}, doi = {10.1016/J.MICROREL.2005.10.011}, timestamp = {Sat, 30 Sep 2023 10:21:32 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChongCPNTL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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