BibTeX record journals/mr/DreesenCMCSPG01

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@article{DBLP:journals/mr/DreesenCMCSPG01,
  author       = {R. Dreesen and
                  Kris Croes and
                  Jean Manca and
                  Ward De Ceuninck and
                  Luc De Schepper and
                  A. Pergoot and
                  Guido Groeseneken},
  title        = {A new degradation model and lifetime extrapolation technique for lightly
                  doped drain nMOSFETs under hot-carrier degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {3},
  pages        = {437--443},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00225-0},
  doi          = {10.1016/S0026-2714(00)00225-0},
  timestamp    = {Sun, 02 Oct 2022 15:44:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DreesenCMCSPG01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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