BibTeX record journals/mr/DrielZJESCY03

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@article{DBLP:journals/mr/DrielZJESCY03,
  author       = {W. D. van Driel and
                  G. Q. Zhang and
                  J. H. J. Janssen and
                  Leo J. Ernst and
                  Fei Su and
                  Kerm Sin Chian and
                  Sung Yi},
  title        = {Prediction and verification of process induced warpage of electronic
                  packages},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {5},
  pages        = {765--774},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00057-X},
  doi          = {10.1016/S0026-2714(03)00057-X},
  timestamp    = {Sat, 22 Feb 2020 19:29:24 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DrielZJESCY03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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