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BibTeX record journals/mr/KhooTV03
@article{DBLP:journals/mr/KhooTV03, author = {Sherry Suat Cheng Khoo and Pee Ya Tan and Steven H. Voldman}, title = {Microanalysis and electromigration reliability performance of high current transmission line pulse {(TLP)} stressed copper interconnects}, journal = {Microelectron. Reliab.}, volume = {43}, number = {7}, pages = {1039--1045}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00133-1}, doi = {10.1016/S0026-2714(03)00133-1}, timestamp = {Sat, 22 Feb 2020 19:27:52 +0100}, biburl = {https://dblp.org/rec/journals/mr/KhooTV03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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