BibTeX record journals/mr/ToutahTLBMB03

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@article{DBLP:journals/mr/ToutahTLBMB03,
  author       = {Hamid Toutah and
                  Boubekeur Tala{-}Ighil and
                  Jean{-}Fran{\c{c}}ois Llibre and
                  Bertrand Boudart and
                  Taieb Mohammed{-}Brahim and
                  Olivier Bonnaud},
  title        = {Degradation in polysilicon thin film transistors related to the quality
                  of the polysilicon material},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1531--1535},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00271-3},
  doi          = {10.1016/S0026-2714(03)00271-3},
  timestamp    = {Sat, 22 Feb 2020 19:27:20 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ToutahTLBMB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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