BibTeX record journals/mr/YangW01

download as .bib file

@article{DBLP:journals/mr/YangW01,
  author       = {Nian Yang and
                  Jimmie J. Wortman},
  title        = {A study of the effects of tunneling currents and reliability of sub-2
                  nm gate oxides on scaled n-MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {1},
  pages        = {37--46},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00099-8},
  doi          = {10.1016/S0026-2714(00)00099-8},
  timestamp    = {Sat, 22 Feb 2020 19:27:09 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YangW01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.