BibTeX record journals/mr/ZhaoXT06

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@article{DBLP:journals/mr/ZhaoXT06,
  author       = {Yao Zhao and
                  Mingzhen Xu and
                  Changhua Tan},
  title        = {Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET
                  degradation under different stress modes},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {164--168},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.05.002},
  doi          = {10.1016/J.MICROREL.2005.05.002},
  timestamp    = {Sat, 22 Feb 2020 19:27:55 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhaoXT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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