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BibTeX record journals/tc/AgarwalF81
@article{DBLP:journals/tc/AgarwalF81, author = {Vinod K. Agarwal and Andy S. F. Fung}, title = {Multiple Fault Testing of Large Circuits by Single Fault Test Sets}, journal = {{IEEE} Trans. Computers}, volume = {30}, number = {11}, pages = {855--865}, year = {1981}, url = {https://doi.org/10.1109/TC.1981.1675716}, doi = {10.1109/TC.1981.1675716}, timestamp = {Sat, 20 May 2017 00:24:29 +0200}, biburl = {https://dblp.org/rec/journals/tc/AgarwalF81.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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