BibTeX record journals/tr/ZhangSHZLX16

download as .bib file

@article{DBLP:journals/tr/ZhangSHZLX16,
  author       = {Zhengxin Zhang and
                  Xiao{-}Sheng Si and
                  Chang{-}Hua Hu and
                  Qi Zhang and
                  Tian{-}Mei Li and
                  Cong{-}Qi Xu},
  title        = {Planning Repeated Degradation Testing for Products With Three-Source
                  Variability},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {65},
  number       = {2},
  pages        = {640--647},
  year         = {2016},
  url          = {https://doi.org/10.1109/TR.2015.2512223},
  doi          = {10.1109/TR.2015.2512223},
  timestamp    = {Sat, 30 Sep 2023 10:29:38 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/ZhangSHZLX16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics