BibTeX record journals/tvlsi/AgarwalN08

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@article{DBLP:journals/tvlsi/AgarwalN08,
  author       = {Kanak Agarwal and
                  Sani R. Nassif},
  title        = {The Impact of Random Device Variation on {SRAM} Cell Stability in
                  Sub-90-nm {CMOS} Technologies},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {16},
  number       = {1},
  pages        = {86--97},
  year         = {2008},
  url          = {https://doi.org/10.1109/TVLSI.2007.909792},
  doi          = {10.1109/TVLSI.2007.909792},
  timestamp    = {Wed, 11 Mar 2020 18:18:48 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/AgarwalN08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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