BibTeX record journals/vlsi/KanjJN11

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@article{DBLP:journals/vlsi/KanjJN11,
  author       = {Rouwaida Kanj and
                  Rajiv V. Joshi and
                  Sani R. Nassif},
  title        = {The Impact of Statistical Leakage Models on Design Yield Estimation},
  journal      = {{VLSI} Design},
  volume       = {2011},
  pages        = {471903:1--471903:12},
  year         = {2011},
  url          = {https://doi.org/10.1155/2011/471903},
  doi          = {10.1155/2011/471903},
  timestamp    = {Sat, 24 Nov 2018 11:58:53 +0100},
  biburl       = {https://dblp.org/rec/journals/vlsi/KanjJN11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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