BibTeX record conf/issta/XinR17

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@inproceedings{DBLP:conf/issta/XinR17,
  author    = {Qi Xin and
               Steven P. Reiss},
  editor    = {Tevfik Bultan and
               Koushik Sen},
  title     = {Identifying test-suite-overfitted patches through test case generation},
  booktitle = {Proceedings of the 26th {ACM} {SIGSOFT} International Symposium on
               Software Testing and Analysis, Santa Barbara, CA, USA, July 10 - 14,
               2017},
  pages     = {226--236},
  publisher = {{ACM}},
  year      = {2017},
  url       = {https://doi.org/10.1145/3092703.3092718},
  doi       = {10.1145/3092703.3092718},
  timestamp = {Tue, 06 Nov 2018 16:57:30 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/issta/XinR17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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