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ORCID"Low Power Test-Compression for High Test-Quality and Low Test-Data Volume."
Vasileios Tenentes, Xrysovalantis Kavousianos (2011)
- Vasileios Tenentes, Xrysovalantis Kavousianos:
Low Power Test-Compression for High Test-Quality and Low Test-Data Volume. Asian Test Symposium 2011: 46-53
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