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"Smart dynamic sampling for wafer at risk reduction in semiconductor ..."
Sylvain Housseman et al. (2014)
- Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodríguez-Verján, Jacques Pinaton:
Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing. CASE 2014: 780-785
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