"Characterizing Process Variation in Nanometer CMOS."

Kanak Agarwal, Sani R. Nassif (2007)

Details and statistics

DOI: 10.1145/1278480.1278582

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.