"Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions."

Debashis Bhattacharya, Prathima Agrawal, Vishwani D. Agrawal (1992)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2017-03-16

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Debashis Bhattacharya, Prathima Agrawal, Vishwani D. Agrawal:
Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions. DAC 1992: 159-164

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