"Resistive-open defect injection in SRAM core-cell: analysis and comparison ..."

Luigi Dilillo et al. (2005)

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DOI: 10.1145/1065579.1065804

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862

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