"Automatic test pattern generation for functional RTL circuits using ..."

Indradeep Ghosh, Masahiro Fujita (2000)

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DOI: 10.1145/337292.337309

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Indradeep Ghosh, Masahiro Fujita:
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams. DAC 2000: 43-48

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