"Path delay test compaction with process variation tolerance."

Seiji Kajihara et al. (2005)

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DOI: 10.1145/1065579.1065802

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato:
Path delay test compaction with process variation tolerance. DAC 2005: 845-850

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