"SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open ..."

Hyung Ki Lee, Dong Sam Ha (1990)

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DOI: 10.1145/123186.123432

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Hyung Ki Lee, Dong Sam Ha:
SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits. DAC 1990: 660-666

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