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"A scan BIST generation method using a markov source and partial bit-fixing."

Wei Li et al. (2003)

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DOI: 10.1145/775832.775974

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/LiYRP03
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  - https://dblp.org/rec/conf/dac/LiYRP03
Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz:
A scan BIST generation method using a markov source and partial bit-fixing. DAC 2003: 554-559

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