"A methodology for modeling the effects of systematic within-die ..."

Vikas Mehrotra et al. (2000)

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DOI: 10.1145/337292.337370

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-27

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Vikas Mehrotra, Shiou Lin Sam, Duane S. Boning, Anantha P. Chandrakasan, Rakesh Vallishayee, Sani R. Nassif:
A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance. DAC 2000: 172-175

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