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"Current problems related to LSI functional testing."

Robert W. Rozeboom (1976)

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DOI: 10.1145/800146.804815

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/Rozeboom76
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  - https://dblp.org/rec/conf/dac/Rozeboom76
Robert W. Rozeboom:
Current problems related to LSI functional testing. DAC 1976: 203-204

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