"Accurate and efficient gate-level parametric yield estimation considering ..."

Ashish Srivastava et al. (2005)

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DOI: 10.1145/1065579.1065718

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Stephen W. Director:
Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540

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