"Automated failure population creation for validating integrated circuit ..."

Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton (2009)

> Home

Details and statistics

DOI: 10.1145/1629911.1630096

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/TamPB09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/TamPB09
Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton:
Automated failure population creation for validating integrated circuit diagnosis methods. DAC 2009: 708-713

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.