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"Adaptive test elimination for analog/RF circuits."

Ender Yilmaz, Sule Ozev (2009)

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DOI: 10.1145/1629911.1630098

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Ender Yilmaz, Sule Ozev:
Adaptive test elimination for analog/RF circuits. DAC 2009: 720-725

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