"Soft Faults and the Importance of Stresses in Memory Testing."

Zaid Al-Ars, Ad J. van de Goor (2004)

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DOI: 10.1109/DATE.2004.1269037

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zaid Al-Ars, Ad J. van de Goor:
Soft Faults and the Importance of Stresses in Memory Testing. DATE 2004: 1084-1091

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