"Thermal analysis and model identification techniques for a logic + WIDEIO ..."

Francesco Beneventi et al. (2014)

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DOI: 10.7873/DATE.2014.345

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - https://dblp.org/rec/conf/date/BeneventiBVDB14
Francesco Beneventi, Andrea Bartolini, Pascal Vivet, Denis Dutoit, Luca Benini:
Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip. DATE 2014: 1-4

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