"A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern ..."

Swarup Bhunia et al. (2005)

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DOI: 10.1109/DATE.2005.27

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik Roy:
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application. DATE 2005: 1136-1141

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