"Analytical model for SRAM dynamic write-ability degradation due to gate ..."

Vikas Chandra, Robert C. Aitken (2011)

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DOI: 10.1109/DATE.2011.5763306

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vikas Chandra, Robert C. Aitken:
Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. DATE 2011: 1172-1175

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