"Utilization of SECDED for soft error and variation-induced defect ..."

Luong Dinh Hung et al. (2007)

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type: Conference or Workshop Paper

metadata version: 2018-11-28

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Luong Dinh Hung, Hidetsugu Irie, Masahiro Goshima, Shuichi Sakai:
Utilization of SECDED for soft error and variation-induced defect tolerance in caches. DATE 2007: 1134-1139

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