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"Test cost reduction for multiple-voltage designs with bridge defects ..."

S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod (2009)

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DOI: 10.1109/DATE.2009.5090874

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - https://dblp.org/rec/conf/date/KhursheedAH09
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod:
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. DATE 2009: 1349-1354

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