"Test cost reduction for multiple-voltage designs with bridge defects ..."

S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod (2009)

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DOI: 10.1109/DATE.2009.5090874

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-31

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S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod:
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. DATE 2009: 1349-1354

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