"Quick error detection tests with fast runtimes for effective post-silicon ..."

David Lin et al. (2015)

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type: Conference or Workshop Paper

metadata version: 2021-08-09

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David Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra:
Quick error detection tests with fast runtimes for effective post-silicon validation and debug. DATE 2015: 1168-1173

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